Daily Papers

Bug reports are an essential aspect of software development, and it is crucial to identify and resolve them quickly to ensure the consistent functioning of software systems. Retrieving similar bug reports from an existing database can help reduce the time and effort required to resolve bugs. In this paper, we compared the effectiveness of semantic textual similarity methods for retrieving similar bug reports based on a similarity score. We explored several embedding models such as TF-IDF (Baseline), FastText, Gensim, BERT, and ADA. We used the Software Defects Data containing bug reports for various software projects to evaluate the performance of these models. Our experimental results showed that BERT generally outperformed the rest of the models regarding recall, followed by ADA, Gensim, FastText, and TFIDF. Our study provides insights into the effectiveness of different embedding methods for retrieving similar bug reports and highlights the impact of selecting the appropriate one for this task. Our code is available on GitHub.

Is there a statistical difference between Naive Bayes and Random Forest in terms of recall, f-measure, and precision for predicting software defects? By utilizing systematic literature review and meta-analysis, we are answering this question. We conducted a systematic literature review by establishing criteria to search and choose papers, resulting in five studies. After that, using the meta-data and forest-plots of five chosen papers, we conducted a meta-analysis to compare the two models. The results have shown that there is no significant statistical evidence that Naive Bayes perform differently from Random Forest in terms of recall, f-measure, and precision.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.